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G00600 - SEMI G6 - 検査方法 封止リング平坦度 StdTpc-Physical Interfaces SEMI E133-1110 (technical revision)

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SEMI E133-1110 (technical revision)

This Specification covers dimensional

この文書は,その他の

SEMI MF928-0317 (Reapproved 0622)

very small densities of these impurities (»1010 atoms/cm3) reduce the carrier recombination lifetime and adversely affect device and circuit performance

G00600 - SEMI G6 - 検査方法 封止リング平坦度 StdTpc-Physical Interfaces SEMI E133-1110 (technical revision)38. 382 mm0. 330 8. 382 mm0. 330 Referenced SEMI Standards None.

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