E03000 - SEMI E30 - 製造装置の通信およびコントロールのための包括的モデル（GEM） Revision:SEMI E30-0418 - Superseded To be measured by this

To be measured by this Test Method

メンテナンスあるいはサービスに必要なあらゆる装置が含まれる。

Wafers must be accurately aligned in various processing equipment during integrated circuit manufacture

and displays

·    碰撞保護

E03000 - SEMI E30 - 製造装置の通信およびコントロールのための包括的モデル（GEM） Revision:SEMI E30-0418 - Superseded To be measured by thisNOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. SEMI SEMI GEMSECS IIGEMGEMGEMSECS IISECS II GEMSECS IISECS IIGEM GEM SECS II SECS II SECS II GEM2 GEM GEM Referenced SEMI Standards (purchase separately) SEMI E4 Specification for SEMI Equipment Communications Standard 1 Message Transfer (SECS