Semiconductor devices. Mechanical and climatic test methods - Internal moisture content measurement and the analysis of other residual gases Ingestion-build-223009 Such detailed specifications are used

Such detailed specifications are used for the safety tests and quality assurance of these fixed inductors

BS EN 60603-7-7:2010 includes some technical changes with respect to EN 60603-7-7:2006

person or body to specified requirements can be substantiated by supporting documentation under the responsibility of the supplier

Contents of BS EN 15626:

that enables you the determination of the OFA input reflectance with the use of an optical branching device

Semiconductor devices. Mechanical and climatic test methods - Internal moisture content measurement and the analysis of other residual gases Ingestion-build-223009 Such detailed specifications are used1 Scope This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high