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Elements of electrical and optical connection. Test methods - Holding force of grounding spring system Ingestion-build-224916 5 Anti-slip surface

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5 Anti-slip surface

This document applies to test for both open and closed loop piezoresistive MEMS pressure devices on wafer

Clause 4 to be documented

Figure 2 – Typical attachment device

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Elements of electrical and optical connection. Test methods - Holding force of grounding spring system Ingestion-build-224916 5 Anti-slip surface

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