Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level Ingestion-build-181247 ISO 7526 is applicable to

ISO 7526 is applicable to normal production operations

Assessment of uncertainties in the derived performance parameters at Location 2

number and offset of allocated resource blocks (RB)

BS EN 599-2 is used in conjunction with EN 599-1

In addition to the requirements specified within this International Standard

Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level Ingestion-build-181247 ISO 7526 is applicable to1 Scope This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto electronic devices, hybrid integrated circuits (HICs), and