Semiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices Ingestion-build-46800 High-strength grades of drill-pipe

High-strength grades of drill-pipe

transparent fibre made by drawing glass (silica) or plastic to a diameter slightly thicker than that of a human hair

but it is strongly recommended that expert advice be taken before such use

Annotea [2]

manufacturer’s instructions

Semiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices Ingestion-build-46800 High-strength grades of drill-pipe1 Scope This Part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge based methods such as in JESD94.